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Advanced Imaging and Microscopy Laboratory (AIMLab)

Principal Investigator: 
1237 Jeong H. Kim Engineering Building

The Advanced Imaging and Microscopy Laboratory (AIMLab; formerly known as the Nanoscale Imaging, Spectroscopy, and Properties Laboratory [NISPLab]), directed by Dr. Wen-An Chiou, is focused on nanoscale characterization of materials and structures generated in Maryland NanoCenter research laboratories or in the FabLab complex. It features high resolution transmission electron microscopy, secondary electron microscopy, scanning Auger microscopy, and scanning probe techniques for atomic- and nano-scale characterization. It is located in a section of the Kim Building designed for low vibration so that best possible spatial resolution can be achieved from the instruments there. The AIMLab is adjacent to and integrated with the Keck Laboratory for Combinatorial Nanosynthesis and Multiscale Characterization.

AIMLab's equipment includes:

  • A Hitachi SU-70 field emission scanning electron microscope (FE-SEM) equipped with an energy-dispersive x-ray spectrometer (EDS)
  • A JEOL 2100F atomic-resolution field emission transmission electron microscope (FE-TEM)
  • A JEM 2100 LaB6 transmission electron microscope (TEM) equipped with fiber optic, video-rate imaging
  • A JEOL JXA-89 electron microprobe equipped with a wavelength-dispersive x-ray spectrometer (WDS)