MSE Seminar Series: C. Barry Carter
Friday, April 23, 2010
Room 2108 Chemical and Nuclear Engineering Bldg.
TEM and SEM of SOFC Materials and Related Systems
C. Barry Carter
Head, Chemical, Materials & Biomolecular Engineering
University of Connecticut
General Secretary, the International Federation of Societies for Microscopy
Editor-in-Chief, Journal of Materials Science
Transmission Electron Microscopy and Scanning Electron Microscopy can be combined to provide microstructural and chemical information that is essential if we are to understand how interfaces in the Ceramic Materials used in SOFCs control the properties of these materials. Only using these two tools can we identify the local crystallography and chemistry of the interfaces and learn about local bonding, with near atomic resolution and relate these features to features at a more macroscopic scale. However, there is still a dearth of systematic studies, especially using model material systems: providing this type of information continues to be the emphasis of our research. The present talk will be illustrated by results from our programs on Ceria, Barium Cerate, and some zirconia-based materials. In passing, I will also illustrate some of the potential pitfalls encountered when using TEM to study interfaces; these examples illustrate some of the challenges we must remember when interpreting images of Ceramic Materials in general, and of interfaces in particular.
The talk will illustrate current approaches we are exploring that use different Ceramic Materials systems; we pay particular attention to solid-state reactions and utilize the growth of model thin films. Throughout the talk, other characterization techniques, particularly AFM and VLM, will be used to complement the information obtained in the TEM and SEM; the FIB should also play a critical role in all future studies. The textbooks on Transmission Electron Microscopy and Ceramic Materials will be mentioned frequently!