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Materials Science and Engineering Seminar Series: Jim Cline and Don Windover
Friday, October 15, 2010
1:00 p.m.-2:00 p.m.
Room 2108, Chemical and Nuclear Engineering Bldg.
For More Information:
JoAnne Kagle
(301) 405-5240

NIST X-Ray Metrology

Part 1: Standard Reference Materials for Powder Diffraction
Part 2: Challenges of femto-scale SI-traceability

James P. Cline and Donald Windover
Ceramics Division, Material Measurement Laboratory
National Institute of Standard and Technology (NIST)

Our X-ray metrology (XRM) project team at the National Institute of Standards and Technology (NIST) works exclusively in developing Standard Reference Materials (SRMs) for the powder diffraction (PD), high-resolution x-ray diffraction (HRXRD), and X-ray reflectometry (XRR) communities. In this two-part presentation, we will present: First, our approach to making X-ray diffraction Standard Reference Materials and show how these standards help calibrate Powder diffraction instrumentation world-wide. Second, we will reveal some of the demanding aspects of establishing SI-traceability specifically how we perform femto-meter-accuracy, nano-scale measurements.

This Event is For: Graduate • Faculty • Post-Docs

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