Materials Characterization

Researchers who study materials characterization are concerned with the way the structure of materials are examined.

Various levels of structural analysis include:

• Atomic structure
• Nanostructure
• Microstructure
• Macro structure

Specific examples include:

• Surface, Interface and Thin Film Analysis
• Scanning Probe Micrsoscopy and Novelprobe Techniques
• Transmission Electron Microscopy
• Dynamic Properties Characterization at the Nanoscale
• Spectroscopy of Nanomaterials

Subcategories include: Surface, Interface and Thin Film Analysis; Scanning Probe Microscopy and Novelprobe Techniques; Transmission Electron Microscopy; Dynamic Properties Characterization at the Nanoscale, and Spectroscopy of Nanomateria.

Faculty Members:

John Cumings Associate Professor 301-405-0789 | cumings@umd.edu Profile

Liangbing Hu Distinguished University Professor 301-405-9303 | binghu@umd.edu Profile

Yifei Mo Professor 301-405-7613 | yfmo@umd.edu Profile

Gottlieb S. Oehrlein Professor 301-405-8931 | oehrlein@umd.edu Profile

Ray Phaneuf Professor 301-405-6566 | phaneuf@lps.umd.edu Profile

Gary Rubloff Distinguished University Professor 301-405-3011 | rubloff@umd.edu Profile

Lourdes G. Salamanca-Riba Professor 301-405-5220 | riba@umd.edu Profile

Ichiro Takeuchi Professor and Interim Chair 301-405-6809 | takeuchi@umd.edu Profile

Eric Wachsman Professor 301-405-8193 | ewach@umd.edu Profile