MSE Alumni Wins MRS Graduate Student Silver Award
Joshua Taillon, currently a NRC Postdoc Research Associate at the National Institute of Standards and Technology (NIST), was honored by the Materials Research Society at their fall meeting, November 30, 2016. He received the award based on the talk he gave at the MRS meeting entitled, “Analytical Electron Microscopy of Interfacial States in 4H-SiC/SiO2MOS Devices.”
Taillon, advised by Professor Lourdes Salamanca-Riba, defended his dissertation in July of 2016. In collaboration with the Army Research Laboratory, Rutgers University and Auburn University, Taillon investigated the defects formed at the interface between silicon dioxide (SiO2) and silicon carbide (SiC) that degrade the charge mobility of metal oxide semiconductor field effect transistors utilized in high temperature, high power and high frequency applications.
His current research includes the development and application of novel data acquisition and processing schemes in electron and ion-beam microscopy, which will allow for smarter and faster materials characterization.
Published January 3, 2017